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X射线衍射仪
X射线衍射
In this paper, a micro-computerized upgrading method for old model x-ray diffractometer, as well as its data collection and analysis system (XRDS) are recommended.
介绍一种旧型号的X射线衍射仪微机化的升级改造技术以及相应的数据采集与分析系统(XRDS)。
The crystal structure and morphology of the as-synthesized product were characterized by X-ray diffractometer, scanning electron microscope and high-resolution transmission electron microscope.
利用X射线衍射仪、扫描电子显微镜和高分辨透射电子显微镜对所得产物的晶体结构和形貌进行了表征。
test methods of crystalline layered sodium disilicate - Qualitative analysis of delta-crystalline layered sodium disilicate - Method of X-ray diffractometer
层状结晶二硅酸钠试验方法 δ相层状结晶二硅酸钠定性分析 X射线衍射仪法
The microstructure of carbon fibers has been studied using X-ray diffractometer(XRD), transmission electron microscope(TEM) and high-resolution transmission electron microscope(HRTEM).
More than thirty years ago, Rigaku invented the benchtop X-ray diffractometer with the introduction of the original Miniflex.
三十多年前,理学公司发明了采用原始Miniflex的台式X射线衍射仪。
Figure 1 shows a set of in-plane and out-of-plane scans from ZnO film on a c-axis sapphire substrate collected on the SmartLab X-ray diffractometer with the in-plane arm.
The density of the sample was determined by the drainage method; the microhardness of the WC was tested by the X-ray diffractometer and the JSM-6360LV scanning electron microscope for the WC phase composition and the microhardness tester.
The versatile SmartLab X-ray diffractometer, was used for both techniques.
多功能SmartLab X射线衍射仪可用于这两种技术。
XRD diffractograms were recorded in the 2θ range (8-80º) using a BrukerAXS D8 Advance X-ray diffractometer with CuKa radiation at a wavelength of 1.5406 Å.
More than thirty years ago, Rigaku invented the benchtop X-ray diffractometer with the introduction of the original Miniflex.
30年前,理学开发了台式X射线衍射仪MiniFlex II的原型。
It is fabricated by means of mechanical method after the PREP Ti-14Al-21Nb alloy powder were copmacted by HIP. The tensile property is measured by INSTRON 1185 Tensile Experimental Mechanism. The microstructure is analyzed by Optical Microscop, SEM and X-ray Diffractometer.
Using the D8-Advance X-ray diffractometer MoSi2 powder and coating testing phase composition
采用D8-Advance型X射线衍射仪检测MoSi2粉末和涂层的物相组成;
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