Traducere "pattern formation method using" în japoneză
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を用いたパターン形成方法
A polymerizable composition for a solder resist, comprising an infrared ray blocking material, a polymerization initiator and a polymerizable compound; and a solder resist pattern formation method using the polymerizable composition for a solder resist.
A resist composition containing a compound represented by general formula (1) or (2), a resist pattern formation method using said resist composition, a polyphenol compound used in the resist pattern formation method, and an alcohol compound capable of being derived from said polyphenol compound.
It is intended to provide a processing liquid for resist substrates, which makes it possible to simultaneously and readily solve the problems of foreign matters sticking to pattern surface, pattern inversion and pattern roughness, and a pattern formation method using the same.
The present invention addresses the problem of providing a composition for forming a resist underlayer film that enables a resist underlayer film to be formed that has excellent etching performance and reduced reflectance, as providing a pattern formation method using the same.
Specifically disclosed are: a cyclic compound having a specific structure; a process for producing the cyclic compound; a radiation-sensitive composition containing the compound; and a resist pattern formation method using the composition.
Disclosed are: a cyclic compound which has high solubility in a safe solvent, is highly sensitive, enables the formation of a resist pattern having a good shape, and rarely causes resist pattern collapse; a process for producing the cyclic compound; a radiation-sensitive composition containing the cyclic compound; and a resist pattern formation method using the composition.
Disclosed are: a composition for forming a resist underlayer film for electron beam or EUV lithography, which can be used in a device manufacture process that employs electron beam or EUV lithography, is rarely subjected to the adverse effects of electron beam or EUV, and is effective for the formation of a good resist pattern; and a resist pattern formation method using the composition.
NOVEL SULFONIC ACID SALT AND DERIVATIVE THEREOF, PHOTOACID GENERATOR AGENT, AND RESIST MATERIAL AND PATTERN FORMATION METHOD USING THE PHOTOACID GENERATOR AGENT
新規スルホン酸塩及びその誘導体、光酸発生剤並びにこれを用いたレジスト材料及びパターン形成方法
BASE-GENERATING AGENT, PHOTOSENSITIVE RESIN COMPOSITION, PATTERN-FORMING MATERIAL COMPRISING THE PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMATION METHOD USING THE PHOTOSENSITIVE RESIN COMPOSITION, AND ARTICLE
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