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图案形成装置
a patterning device configured to pattern the radiation beam
图案形成装置,配置成图案化所述辐射束;
using a patterning device to provide a radiation beam with a pattern in its cross-section
使用图案形成装置以在辐射束的横截面上给辐射束提供图案;
In step 808, the corrected beam of radiation is directed onto a patterning device to form a patterned radiation beam.
在步骤808,校正后的辐射束被引导到图案形成装置上以形成图案化的辐射束。
However, in a transmissive lithographic apparatuses, where the radiation beam is transmitted through the patterning device, the article support 3 and electrostatic clamp 1 may be constructed in order to allow the projection beam to pass through.
Reducing a gain will allow the reticle stage 1020 to rotate about the x and y axes in response to the reaction force and reaction torques from the tilted patterning device 1010.
Subsequently, in action 33, the beam of radiation is imparted with a pattern in its cross-section by a patterning device, e.g. a mask, to form a patterned beam of radiation.
As illustrated in FIG. 8, the patterning device pattern further diffracts the beam B2 into a zero and a first order diffracted beam, respectively beams DB20 and DB21.
The lithographic apparatus according to claim 4, wherein the voltage supply is configured to provide a pulsed voltage difference between the patterning device and ground during operation of the lithographic apparatus, the pulses of voltage difference being synchronized to pulses of the beam of radiation incident on the patterning device.
That's a Jacquard card, so that's the patterning device which will actually determine the patterns for the lace.
那是提花纹板 那个提花装置将决定花边的花样
Optical Projection Lithography Masks are used in semiconductor processing, as they are the base patterning device of the IC chip. Defects in masks can be fixed via the use of specialized repair equipment utilizing a very fine focused ion beam.
半导体加工中使用光学投影蚀刻光罩,它们是 IC 芯片的基本布线设备。利用采用非常精密聚焦离子束的专用修补设备,这些光罩的缺陷可以得到修补。
By the appropriate selection of the voltage difference between the patterning device 12 and ground, the contaminant particles charged by the beam of radiation being patterned by the patterning device 12 may be repelled from the patterning device 12 by an electrostatic force.
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