Translation of "x-ray diffraction pattern" in Chinese
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X射线衍射图
X 射线衍射图案
Shown in the X-ray diffraction pattern below is a sample that is primarily comprised of calcite.
下图是一个主要成分为方解石的样品的X射线衍射图。
Preferably, the intensity of the peak C is too low to be visually measured in the X-ray diffraction pattern.
优选地, C 峰的强度过低而无法在 X 射线衍射图案中目测到。
As for the active material particles contained in the active substance for a battery according to the first embodiment, in the X-ray diffraction pattern, the intensity I B of the peak B attributed with the (003) plane and the intensity I C of the peak C attributed to the (-602) plane are relatively small.
关于根据第一实施方案的电池用活性物质中所含的活性材料粒子,在 X 射线衍射图案中,归属于 (003) 平面的 B 峰的强度 IB 和归属于 (-602) 平面的 C 峰的强度 IC 相对较小。
The measurement conditions were the same as Example 1. The X-ray diffraction pattern obtained by the measurement is shown in FIG. 10.
测量条件与实施例 1 相同。通过测量获得的 X 射线衍射图案示于图 10 中。
{\f9 The X-ray diffraction pattern of the active material particles contained in the active substance for a battery according to the first embodiment is obtained by X-ray diffraction (XRD) using Cu-Ka r ays.
根据第一实施方案的电池用活性物质中所含的活性材料粒子的 X 射线衍射图案是通过使用{\f9 Cu-Ka 射线的 X 射线衍射 (XRD) 获得。
The active material particles have a peak A, a peak B and a peak C in the X-ray diffraction pattern obtained by the X-ray diffraction method using Cu-Ká rays.
在通过使用{\f9 Cu-Ka 射线的 X 射线衍射方法获得的 X 射线衍射图案中,活性材料粒子具有 A 峰、 B 峰和 C 峰。
1: X-ray diffraction pattern and qualitative analysis results obtained from trace corundum
图1: 从微量刚玉获得的X射线衍射图及定性分析结果
The X-ray diffraction pattern of maize starch granules was constituted of two parts: micro crystal regions and amorphous regions.
玉米淀粉颗粒的X-射线衍射图形是由两部分组成的:微晶区域和无定型区域。
The investigators "successfully and consistently generated the basic alpha-keratin X-ray diffraction pattern in every hair sample."
研究人员在每个头发样本成功地、一致地做出了基本的alpha角蛋白衍射X线的方式。
Fig. 1: X-ray diffraction pattern and qualitative analysis results obtained from trace corundum
In the figure below, the X-ray diffraction pattern of a Gd powder sample prepared by inert gas condensation method is analyzed.
下图中对惰性气体冷凝法制备的Gd粉末样品的X射线衍射图进行分析。
1 shows the X-ray diffraction pattern and qualitative analysis results obtained by measuring a sample in which corundum (weight 0.2 mg) was placed on a non-reflective sample plate.
图1所示为在无反射样品板上放置微量刚玉(重量0.2mg)样品所得到的X射线衍射图及其定性分析结果。
2 shows the X-ray diffraction pattern and qualitative analysis results for Fe oxide, measured using a graphite monochromator.
图2所示为使用阻光刀片测试所得牛奶巧克力和黑巧克力的X射线衍射图。
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