The X-ray beam (red) creates a characteristic diffraction pattern in the detector (right) from which the inner structure of the active layer can be deduced.
Der Röntgenstrahl (rot) erzeugt im Detektor (rechts) ein charakteristisches Streubild, aus dem sich die Struktur der aktiven Schicht bestimmen lässt.
The X-rays produce a characteristic diffraction pattern from which the inner structure of the crystal and hence the protein's spatial structure can be calculated.
With laser diffraction the particle size distribution is determined by the characteristic diffraction pattern of a particle collective. In contrast, image analysis captures the physical properties of each single particle.
Im Gegensatz zur Laserbeugung, bei der die Partikelgrößenverteilung durch das charakteristische Beugungsbild eines Partikelkollektivs bestimmt wird, erfasst die Bildanalyse die physikalischen Eigenschaften jedes einzelnen Partikels.
If a sufficient number of these photons can be measured with a detector, a characteristic diffraction pattern is obtained which can be used to derive the pattern of scattered atoms or the crystal structure.
Misst man ausreichend viele dieser Photonen mit einem Detektor, erhält man ein charakteristisches Beugungsbild oder Wellenmuster, aus dem die Form der Kristallstruktur abgeleitet werden kann.
Other results
Crystalline structures within polymer solar cells cause characteristic diffraction patterns in experiments with synchrotron radiation.
Kristalline Strukturen innerhalb einer organischen Solarzelle führen zu charakteristischen Streubildern in den Synchrotronstrahlungsexperimenten.
Near the focal plane, one can see very characteristic diffraction patterns.
A method for synthesizing a crystalline material exhibiting a characteristic X-ray diffraction pattern including d-spacing maxima values shown below
Verfahren zum Synthetisieren eines kristallinen Materials, das ein charakteristisches Röntgenbeugungsspektrum aufweist, das die nachfolgend gezeigten d-Abstandmaximalwerte aufweist
The characteristic x-ray diffraction pattern generated in a typical XRD analysis provides a unique "fingerprint" of the crystals present in the sample.
A crystalline silicoaluminophosphate molecular sieve having a characteristic X-ray powder diffraction pattern containing at least the d-spacings as set forth in Table Ia and comprising. N, N-dimethylethanolamine within its intra-crystalline structure.
Kristallines Siliciumaluminiumphosphat-Molekularsieb mit einem charakteristischen Pulverröntgenbeugungsspektrum, das mindestens die d-Abstände wie in Tabelle Ia beschrieben enthält und N, N-Dimethylethanolamin in seiner intrakristallinen Struktur enthält.
The metallophosphoaluminate of Claim 1 wherein the element M is vanadium and having the characteristic X-ray diffraction pattern given in Table 4.
The molecular sieve of claim 15, having a characteristic X-ray powder diffraction pattern containing at least the d-spacings as set forth in Table IIb.
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