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In the sensor region, a capacitance type acceleration sensor is formed by processing a semiconductor substrate surface layer section that faces the hollow.
Disclosed is a semiconductor device wherein a semiconductor substrate has a sensor region and an integrated circuit region, and a hollow is formed directly under the surface layer section in the sensor region.
The heat detecting section, i.e., a surface layer section of the ceramic body (10), generates heat due to, for instance, radiative heat transfer, and a resistance value of a thermistor ceramic layer between the heat detecting section electrodes (1, 2) is reduced.
The method includes steps performed in the following order; (a) a step of forming a magnetic layer on a nonmagnetic substrate, (b) a step of exposing to reactive plasma or reactive ions a surface layer section of the magnetic layer in a region from which the magnetic layer is to be removed, and (c) a step of irradiating the magnetic layer with an inert gas.
In the outermost surface layer section of the composite resin particles, polystyrene resin having a particle size of 0.3-1.5 µm is dispersed in the polypropylene resin.
A semiconductor element (1) contains: an n-type epitaxial layer (8); body regions (12) formed in the surface layer section of the n-type epitaxial layer (8); n-type source regions (16) formed in the surface layer sections of the body regions (12); a gate insulator film (19) which is formed on the n-type epitaxial layer (8); and a gate protection diode (30) and gate electrodes (20) formed on the gate insulator film (19).
The surface layer section of the membrane includes one or more types of metal elements from among aluminum (Al), yttrium (Y), magnesium (Mg), and boron (B).
The magnesium alloy wire is used in a member to which bending stress and/or torsional stress are mainly applied, wherein the surface layer section of the wire comprises a portion having a maximum hardness of 170 HV or more, and the inside of the wire has 0.2% yield strength and 5% or more elongation at 550 MPa or more.
A semiconductor device is provided with a semiconductor layer; a source region formed on the surface layer section of the semiconductor layer; a drain region formed on the surface layer section of the semiconductor layer by being spaced apart from the source region; a gate insulating film formed on the surface of the semiconductor layer, in a region facing the surface between the source region and the drain region; a gate electrode formed on the gate insulating film; and a drain-gate separating section arranged between the drain region and the gate insulating film to separate the drain region and the gate insulating film one from the other in a non-contact state.
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