Vertaling van "smartlab" in Chinees
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Rigaku's SmartLab multi-purpose diffractometer has the capability to characterize nanomaterials in virtually all forms.
理学的 SmartLab多功能衍射仪具有定性纳米材料在几乎所有形式的能力。
Rigaku's SmartLab diffractometer, which offers variable resolution optics, is ideal for such purposes.
理学的SmartLab衍射仪提供理想是和该目的的可变分辨率光学。
The measurement was carried out on a SmartLab diffractometer with a graphite monochromator on the detector side.
通过SmartLab衍射仪和探测器一侧的石墨单色器进行测量。
The SmartLab is the most novel high-resolution diffractometer available today.
SmartLab是当下最新型的高分辨率衍射仪。
SmartLab's variable resolution optics allow fast measurement of such nanostructures at medium, high, or ultra-high resolutions.
SmartLab可变分辨率光学系允许快速测量在中、高或超高分辨率的纳米结构。
The SmartLab diffractometer offers automatically aligned, variable resolution (0.002 to 0.1º divergence) optical capabilities for optimal performance over a range of film thicknesses.
SmartLab衍射仪向膜厚范围之内的最佳性能提供自动调整的、可变的分辨率(0.002~0.1º发散)光学能力。
Even when a film thickness is extremely thin, the crystallographic orientation relationship with the substrate can be easily analyzed using Rigaku's SmartLab multipurpose diffractometer equipped with an in-plane attachment by performing the in-plane reciprocal lattice map measurement method.
即使薄膜厚度极其薄,使用理学SmartLab多功能衍射仪并配备一个面内附件通过执行面内倒易格子图测量法,可以轻松分析晶体取向与基板的关系。
The following shows the geometry of Rigaku SmartLab multipurpose diffractometer's goniometer when measuring each rocking curve and the measurement result of the rocking curve by each lattice plane.
以下显示了当测量每个摇摆曲线时,理学SmartLab多功能衍射仪的测角仪的配置,和每个晶面摇摆曲线的测量结果。
Using Rigaku's SmartLab multipurpose diffractometer to measure in-plane diffraction, the crystal structure, lattice constants and crystallite size of a polycrystalline thin film can be found.
使用理学SmartLab多功能衍射仪测量面内衍射,可以找到多晶薄膜的晶体结构、晶格常数和晶粒尺寸。
The SmartLab multipurpose diffractometer with Rigaku's patented cross-beam optics (CBO) offers a parallel beam solution to the first requirement and a completely automated sample alignment package for the second requirement.
SmartLab多功能衍射仪与理学专利的交叉光束光学(CBO)向第一项要求提供一个平行光束解决法,向第二项要求提供一个全自动样品调整程序包。
The variations in the depth direction such as orientation, lattice constant and composition that occur on the surface of thin film can be analyzed non-destructively using the in-plane X-ray diffraction method with Rigaku's SmartLab multipurpose diffractometer.
使用理学SmartLab多功能衍射仪,通过面内X射线衍射法,可以非破坏性分析在薄膜表面上发生的取向、晶格常数和组成在深度方向的变化。
Figure 1 shows the results of X-ray reflectivity measurements taken with Rigaku's SmartLab multipurpose diffractometer for three kinds of insulating films between layers with a different relative permittivity.
图1显示了使用理学SmartLab多功能衍射仪测量拥有不同的相对介电常数图层间的三种绝缘薄膜的X射线反射率结果。
Rigaku's SmartLab multipurpose diffractometer is designed to adapt to various high-resolution XRD needs.
理学的SmartLab多功能衍射仪设计适应各种高分辨率XRD需求。