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smartlab multipurpose diffractometer
Vertaling van "smartlab multipurpose diffractometer" in Chinees
SmartLab多功能衍射仪
Even when a film thickness is extremely thin, the crystallographic orientation relationship with the substrate can be easily analyzed using Rigaku's SmartLab multipurpose diffractometer equipped with an in-plane attachment by performing the in-plane reciprocal lattice map measurement method.
即使薄膜厚度极其薄，使用理学SmartLab多功能衍射仪并配备一个面内附件通过执行面内倒易格子图测量法，可以轻松分析晶体取向与基板的关系。
The following shows the geometry of Rigaku SmartLab multipurpose diffractometer's goniometer when measuring each rocking curve and the measurement result of the rocking curve by each lattice plane.
以下显示了当测量每个摇摆曲线时，理学SmartLab多功能衍射仪的测角仪的配置，和每个晶面摇摆曲线的测量结果。
Using Rigaku's SmartLab multipurpose diffractometer to measure in-plane diffraction, the crystal structure, lattice constants and crystallite size of a polycrystalline thin film can be found.
使用理学SmartLab多功能衍射仪测量面内衍射，可以找到多晶薄膜的晶体结构、晶格常数和晶粒尺寸。
The SmartLab multipurpose diffractometer with Rigaku's patented cross-beam optics (CBO) offers a parallel beam solution to the first requirement and a completely automated sample alignment package for the second requirement.
SmartLab多功能衍射仪与理学专利的交叉光束光学（CBO）向第一项要求提供一个平行光束解决法，向第二项要求提供一个全自动样品调整程序包。
The variations in the depth direction such as orientation, lattice constant and composition that occur on the surface of thin film can be analyzed non-destructively using the in-plane X-ray diffraction method with Rigaku's SmartLab multipurpose diffractometer.
使用理学SmartLab多功能衍射仪，通过面内X射线衍射法，可以非破坏性分析在薄膜表面上发生的取向、晶格常数和组成在深度方向的变化。
Figure 1 shows the results of X-ray reflectivity measurements taken with Rigaku's SmartLab multipurpose diffractometer for three kinds of insulating films between layers with a different relative permittivity.
图1显示了使用理学SmartLab多功能衍射仪测量拥有不同的相对介电常数图层间的三种绝缘薄膜的X射线反射率结果。
Rigaku's SmartLab multipurpose diffractometer is designed to adapt to various high-resolution XRD needs.
理学的SmartLab多功能衍射仪设计适应各种高分辨率XRD需求。
In the Figure 1 below, X-ray diffraction patterns from polyethylene with and without added double-wall carbon nanotubes measured in reflection geometry taken using Rigaku's SmartLab multipurpose diffractometer are presented.
下图为使用理学SmartLab多功能衍射仪，通过反射几何测量添加和没添加双壁碳纳米管的聚乙烯的X射线衍射图。
The SmartLab multipurpose diffractometer, benefiting from its precise optics design and automated alignment procedures, makes SAXS measurement an easy task which requires almost no previous SAXS experience; hence the best choice for materials science research and development.
SmartLab多功能衍射仪受益于其精密的光学设计和自动调节程序，使没有SAXS经验的人也能够轻松进行SAXS测量，因此是材料科学研究和发展的最佳选择。
Figure 1(a) shows the 2θ/θ measurement result of a cobalt (Co) magnetic thin film on a hard disk using Rigaku's SmartLab multipurpose diffractometer.
图1（a）显示使用理学SmartLab多功能衍射仪2θ/θ测量硬盘上钴磁性薄膜的结果。
The figure below, collected using Rigaku's SmartLab multipurpose diffractometer, shows the result of the reflectivity measurement performed on a film of silicon nitride film (Si3 N4).
下图通过理学SmartLab多功能衍射仪收集，显示了在氮化硅（Si3N4）薄膜上执行的反射测量的结果。
From X-ray reflectivity measurements using Rigaku's SmartLab multipurpose diffractometer the film thickness, density and interface roughness of an insulation film of more than about 1 nm can be evaluated in a laboratory.
使用理学的SmartLab多功能衍射仪的X射线反射率测量，可以在实验室中对膜厚、密度和界面粗糙度进行鉴定。
Using Rigaku's SmartLab multipurpose diffractometer equipped with a D/teX one-dimensional X-ray detector, even when the source is a 2 kW sealed tube generator, one can perform the identification and quantification of the material in a short time.
使用理学SmartLab多功能衍射仪配备一维阵列探测器D/teX，即使当放射源为一个2kW的密封式管发生器时，其中一个可以在短时间内执行鉴定和定量分析。
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