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を用いたパターン形成
This invention provides a composition for upper surface antireflection film formation, which prevents pattern failure caused by reflection in a film in an exposure process and is free from a problem of a residue in an etching process, and a method for pattern formation using the same.
This invention provides a film forming composition for nanoimprinting, which has excellent resistance to etching with oxygen gas, can prevent the separation of a transfer pattern, can eliminate a problem of a holing time on a substrate, and is also excellent in transferability, and photosensitive resist, a nanostructure, a method for pattern formation using the same, and a program for realizing the method for pattern formation.
This invention provides a material for pattern formation, which, when a highly transparent material is used as a support for the formation of a pattern like a solder resist, can realize a good resist face shape, a higher-definition pattern, and a suitable blue or green color, and an apparatus for pattern formation, comprising the material for pattern formation, and a method for pattern formation using the material for pattern formation.
This invention provides a positive working resist composition, comprising (A) a resin, which comprises all of repeating units represented by general formulae (I) to (III) and is rendered soluble in an alkali developing solution through the action of an acid, and (B) a compound which generates an acid upon exposure to an actinic radiation or a radiation, and a method for pattern formation using the positive working resist composition.
RESIST MATERIAL AND METHOD FOR PATTERN FORMATION USING THE RESIST MATERIAL
レジスト材料及びそれを用いたパターン形成方法
METHOD OF PATTERN FORMATION USING ULTRAHIGH HEAT RESISTANT POSITIVE PHOTOSENSITIVE COMPOSITION
超高耐熱ポジ型感光性組成物を用いたパターン形成方法
PHOTOSENSITIVE COMPOSITION AND METHOD FOR PATTERN FORMATION USING THE PHOTOSENSITIVE COMPOSITION
感光性組成物及びそれを用いたパターン形成方法
POSITIVE-WORKING PHOTOSENSITIVE COMPOSITION, METHOD FOR PATTERN FORMATION USING THE COMPOSITION, AND RESIN FOR USE IN THE COMPOSITION
ポジ型感光性組成物、該組成物を用いたパターン形成方法、及び、該組成物に用いられる樹脂
This invention provides a positive-working resist composition, which, upon a change in exposure, causes no significant variation in pattern size, and a method for resist pattern formation using the positive-working resist composition.
This invention provides a novel rinsing liquid for lithography, which, for a photoresist pattern, can reduce surface defects, the so-called defects, without sacrificing the quality of the product, and, at the same time, can impart resistance to electron beam irradiation to suppress the shrinkage of the resist pattern, and a method for resist pattern formation using the same.
This invention provides a photosensitive composition, which can simultaneously realize excellent storage stability and high sensitivity and can form a permanent pattern such as a protective film or an insulating film with high definition in an efficient manner, a photosensitive film, a method for permanent pattern formation using the photosensitive composition, and a printed board comprising a permanent pattern formed by the method for permanent pattern formation.
This invention provides a coating forming agent for pattern fining, which does not cause any defect after fining treatment, can suppress and control a variation in the level of fining even in fining treatment of an ultrafine resist pattern, particularly having a size of not more than 120 nm with an enhanced aspect ratio, can maintain a good resist pattern shape after the fining treatment while maintaining the desired fining level, and, at the same time, can eliminate troubles caused by the occurrence of bacteria and the like within a wafer plane after the coating of a coating forming agent for pattern fining, and a method for fine pattern formation using the coating forming agent.
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